Pelcotec SEM magnification calibration standard, G-1 silicon materials embedding stand surface vertically

SKU: 99472243956

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Pelcotec SEM magnification calibration standard, G-1 silicon materials embedding stand surface verticallyThe Pelcotec G 1 calibration specimen with a 1m pitch grid is very useful for magnification calibration or image distortion check in the 100x to 10,000x magnification range. Can be used for SEM, Auger, Sims, FIB, and LM (reflected light). Specimen may also be mounted directly on the Pelcotec G 1 which will give an accurate internal calibration in the image. Particularly useful when working with powders. Possible alternative for the SIRA calbration

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